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PC's Semiconductors Blog

NI expands PXI capabilities for semicon test with new suite of modular instruments

November 10, 2009

AUSTIN, USA: National Instruments (NI) introduced 10 new PXI products that expand the capabilities of PXI for mixed-signal semiconductor test. The suite of new software-defined products, which are optimized for use with NI LabVIEW graphical system design Read more…